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摘要: 在航空航天、核能发电等重大装备技术领域, 作为高温传感/驱动/能量收集器件的敏感材料——铋层状结构铁电(BLSF)陶瓷在复杂载荷环境下的疲劳失效问题严重限制着器件寿命和可靠性的提高. 本文以BLSF陶瓷的应用需求为背景, 围绕铁电材料的疲劳裂纹扩展与电畴极化翻转及其相互作用机制等关键问题, 综述了铁电材料在热、力、电三种载荷及其耦合作用下疲劳失效行为的研究现状, 并根据当前铁电材料的一些新发展、新应用对其未来研究方向进行了展望, 旨在为高性能、长寿命铁电/压电器件设计提供参考.Abstract: In the fields of some major equipment technology such as aerospace and nuclear power generation, as the sensitive elements of high-temperature transforming/actuating/energy harvesting devices, the fatigue failure of bismuth layered ferroelectric (BLSF) ceramics seriously restrict the improvement in the life and reliability of devices. This paper is set in the urgent demand of BLSF ceramics, sticking to the fatigue crack growth, domain polarization switching, and interaction mechanisms. It reviewed the progress in the fatigue failure behaviors of ferroelectric materials subjected to three kinds of loadings, including heat, stress, electricity, and their coupled effects. This paper also discusses the research directions of ferroelectric materials in the future according to their new developments and applications. This work aims at providing references for the design of ferroelectric/piezoelectric devices with long life and high performance.
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Key words:
- ferroelectric materials /
- BLSF ceramics /
- fatigue failure /
- domain switching /
- multi-fields coupling
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图 4 (a)涂覆Ni电极和Ag电极的PZT陶瓷的应力幅值与失效周次关系(S-N曲线), (b)涂覆Ni电极的PZT陶瓷的维氏硬度随载荷循环周次的变化关系(Okayasu et al. 2010)
图 5 用于分析循环载荷下PZT试样累积铁弹应变存在频率效应的标准模型(Pojprapai et al. 2008)
图 6 疲劳试验和敲击输出测试: (a)固定好的PZT薄膜样品及其敲击装置, (i)和(ii)PZT样品在敲击和松弛下的状态, (b) Z1, Z2和Z3的输出电压结果: 在30 Hz敲击幅度、12000次循环过程中每个样品的输出电压都展现出机械稳定性, (i)和(ii): Z1(上级成分梯度薄膜)、(iii)和(iv): Z2(52/48多层薄膜)和(vi)和(vii)Z1: (下级成分梯度薄膜)的测试(Zou et al. 2021)
图 7 BiT陶瓷在不同载荷作用下的疲劳寿命曲线: (a)小杆冲压(Xie et al. 2018a), (b)三点弯曲(Xie et al. 2018b)
图 8 1075 ℃烧结的BiT陶瓷在三点弯曲载荷下的疲劳断口形貌(σ = 75 MPa, Nf = 2.18 × 105) (Xie et al. 2018b): (a)宏观断口, (b)裂纹扩展区
图 9 电场作用下电畴的极化翻转过程(Venkateshwarlu et al. 2020)
图 10 循环电场作用下c-电畴的形成过程(Huang et al. 2021)
图 11 (a) ~ (e) BaTiO3单晶在第一次双极循环后和(f) 10次双极循环后的电畴演化和裂纹扩展, 图片采自于偏振光显微镜(PLM) (Li & Li 2012)
图 12 各种几何形状的PLZT 8/65/35样品中疲劳破坏区的生长: (a)疲劳试验后的样品照片, (b)疲劳破坏区生长量a与循环周次N的关系(Shieh et al. 2006)
图 13 含预制裂纹的PZT-5铁电陶瓷由电场诱导的疲劳裂纹扩展行为: (a)实验原理图, (b)不同外加电场强度(Eappl)下裂纹扩展长度与电场循环周次的关系, (c)Eappl = 0.8Ec下主裂纹尖端附近的微裂纹分布, (d)Eappl = 1.0Ec下主裂纹的扩展情况(Fang & Liu 2004)
图 14 PZT和BSPT陶瓷中(a)压电系数(d33)和(b)介电常数(K)随老化时间的变化(Gotmare et al. 2010)
图 16 四种压电陶瓷在升降温过程中压电常数(d33)的变化(Huang et al. 2018)
图 17 BiT铁电陶瓷经过不同温差热冲击后的断口形貌(Xu et al. 2021)
图 18 BiT铁电陶瓷经过不同温差热冲击后的电滞回线(Xu et al. 2021)
图 19 含预制裂纹的压电陶瓷在交流电场和三点弯曲载荷作用下的动态疲劳行为: (a)动态疲劳测试装置示意图, (b) C-91的断裂载荷与载荷速率的关系, (c) C-91的动态裂纹扩展长度, (d) C-91在交流电场作用下的临界能量释放率(Narita et al. 2012)
图 20 疲劳寿命作为标称场和厚度的函数: (a)计算值(所有情况下: E*f,th = E*cv), (b)实验值(样品均为PZT陶瓷), 损耗值为10% (Arias et al. 2006)
图 21 在正交力电载荷作用下两步连续的90°电畴翻转示意图(Li et al. 2005)
图 22 铁电体材料参数与疲劳机理的关系(Li Y W et al. 2020)
图 24 1 MHz下的疲劳测试(a) Au/BLT/Pt/Ti/SiO2/Si薄膜在3 × 1010次读写循环前(实心圆)后(空心圆)的P-E滞后回线, (b)Psw, Pns, −Psw和−Pns随循环次数的变化. 此处, −Psw和−Pns分别代表反向电场作用在这个电容时的翻转极化和线性非翻转极化(Park et al. 1999)
图 25 BiT陶瓷的3D-PFM图, 多个晶粒在VPFM 模式下的(a1)形貌与(a2)振幅; (a1)图中横向晶粒分别在VPFM, x-LPFM以及y-LPFM模式下的(b)形貌, (c1) (d1) (e1)振幅, (c2) (d2) (e2)相位以及(c3) (d3) (e3)极化矢量分布; (f) (g)铁电畴极化矢量的2D 与3D 模型, 插图表示对应的变体组合 (Xie et al. 2020a)
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